Electronic Resource
Amsterdam
:
Elsevier
International Journal of Radiation Applications & Instrumentation. Part D,
12 (1986), S. 665-668
ISSN:
1359-0189
Keywords:
Electrochemical Etching
;
Etch-spots size
;
Fast-neutrons
;
Inter-Track distance
;
Polycarbonate
;
Recoil-Tracks
;
Response-neutron directional dependence
;
Response-neutron energy dependence
Source:
Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Type of Medium:
Electronic Resource
URL:
http://linkinghub.elsevier.com/retrieve/pii/1359-0189(86)90675-8
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