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  • Articles: DFG German National Licenses  (3)
  • 1995-1999
  • 1975-1979  (3)
  • 1979  (3)
Source
  • Articles: DFG German National Licenses  (3)
Material
Years
  • 1995-1999
  • 1975-1979  (3)
Year
Keywords
  • 1
    Electronic Resource
    Electronic Resource
    The XPS valence band spectra of Hf metal and HfC x N y O z compounds and the correlation to their superconductivity (1979)
    Springer
    The European physical journal 33 (1979), S. 241-250 
    Details
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The x-ray photoemission spectra of the valence bands of Hf metal and of several HfC x N y O z compounds have been measured and are compared to existing band structure calculations. The density of states at the Fermi energy of the HfC x N y O z compounds correlates strongly to their superconducting transition temperatureT c . A calculation of theT c values within the frame work of strong coupling superconductors indicates that the phonon spectrum and the electron phonon interaction is approximately constant within the series HfC x N y O z .
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01323499
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    X-ray excited photoelectron spectra of LiNbO3: A quantitative analysis (1979)
    Springer
    The European physical journal 35 (1979), S. 51-59 
    Details
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract X-ray excited photoelectron spectra (XPS) using monochromatized Al — K α radiation (ℏω =1,486.7 eV) have been analysed quantitatively. The intensities of the various core lines (Li(1s), O(1s), O(2s), Nb(3s), Nb(3p), Nb(3d), Nb(4s), Nb(4p)) normalized to the intensity of the Nb (3d 5/2)-line, show good agreement with those calculated with theoretical values for the photoabsorption cross section of the free atoms and the theoretical estimates of the dependance of the electron escape depth on the electron kinetic energy. From the energy loss spectra observed at the high binding energy side of the XPS core lines the energy loss function Im {−1/ε(ω)} is calculated and compared to published optical data. This comparison yields directly the total electron escape depth as function of the electron energy over a large energy range.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01322081
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Comparisons of the cure of phenol-formaldehyde novolac and resol systems by differential scanning calorimetry (1979)
    New York, NY [u.a.] : Wiley-Blackwell
    Journal of Applied Polymer Science 23 (1979), S. 1973-1985 
    Details
    ISSN: 0021-8995
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Comparisons were made of differential scanning-calorimetric (DSC) thermograms of both liquid and powdered commercial phenol-formaldehyde resins. By a combination of the results from analyses under a variety of conditions, such as ambient pressure, high pressure, using freeze-dried samples, and also by direct observation of the resin-curing process in wood-veneer assemblies, the curing reactions of phenol-formaldehyde resins were found to differ for resol and novolac systems. At a heating rate of 10°C/min, the resol resin showed endothermic curing reactions at temperatures of about 150°C, while the novolac-type resin showed an exothermic peak maximum at about 160°C. Results are presented to show how DSC can be used to differentiate between a resol and novolac system.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/app.1979.070230708
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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