ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
It is shown that the depth distribution of X-ray production in the electron microprobe can be accurately described by a Gaussian modified at the sample surface by a transient. Assuming that the Gaussian is a consequence of the electrons undergoing a random walk in the sample and that the transient corresponds with the change from collimated to random electron trajectories enables theoretical values for the amplitudes and coefficients of the two functions to be predicted. There is excellent agreement between the predicted and the observed values. The Lenard coefficient and the electron range can both be estimated from the coefficient in the Gaussian. It is suggested that for microprobe work, Lenard's law for electron absorption be replaced by this revised law. Both the absorption and atomic number corrections of the traditional ZAF approach are replaced by the new function.
Additional Material:
14 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300100311
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