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  • Articles: DFG German National Licenses  (3)
  • 1985-1989  (3)
  • 1988  (3)
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  • Articles: DFG German National Licenses  (3)
Material
Years
  • 1985-1989  (3)
Year
  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 88 (1988), S. 6884-6888 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Electron attachment and electron impact ionization of SF6 and SF6/Ar clusters have been investigated in a molecular beam/electron impact ion source/mass spectrometer system. Positive ion mass spectra of neat SF6 clusters contain [(SF6)n⋅SFx]+ fragment ion series with 0≤x≤5 and in addition [(SF6)nS2F5]+ ions which have to be formed via international ion molecule reactions. Positive ion mass spectra of mixed SF6/Ar clusters include ion series of nonstoichiometric fragment ions (SF5⋅Arn)+, (SF6⋅SF5⋅Arn)+, [(SF6)2⋅SF5⋅Arn]+, and, in addition, stoichiometric ions comprised of (SF6⋅Arn)+ and [(SF6)2Arn]+. These stoichiometric ions are only present with n≥3. Electron attachment to neat SF6 clusters gives rise only to stoichiometric (SF6)−n ions, whereas attachment to mixed SF6/Ar clusters yields ion series consisting of (ArnSF6)−, [Arn(SF6)2]−, and [Arn⋅(SF6)3]−. This indicates that the dissociative channel into SF−5 present in the monomer is efficiently quenched in case of clusters. The negative ion mass spectra show in contrast to the positive ion mass spectra a strong dependence on electron energy due to a strong resonance of the attachment cross sections near zero electron energy.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 88 (1988), S. 4289-4293 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Clusters of N2 molecules formed in a supersonic nozzle expansion have been studied by electron impact ionization mass spectrometry. Mass resolved spectra (with n up to 190) show three homologous series, i.e., consisting of (N2)+n, (N2)nN+, and [(N2)n N]2+ ions. The distribution of (N2)+n ions shows distinct magic number effects. Moreover, there is evidence for the existence of (N2)2+n and (N2)3+n ions. The critical appearance sizes of observed multiply charged cluster ions are (N2)2+99, (N2)99N2+, and (N2)3+215. These results are compared with theoretical predictions. Moreover, a study of the electron energy dependence of singly and doubly charged N2 cluster ions close to threshold (appearance energies) gives new insight into the ionization mechanism.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 89 (1988), S. 295-301 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Metastable decay of Ar+@B|3 produced by electron impact ionization of a supersonic Ar cluster beam has been investigated qualitatively and quantitatively with a double focusing sector field mass spectrometer. We present direct experimental proof that the observed metastable decay of Ar+*3 into Ar+ in the microsecond time regime proceeds predominantly via a sequential decay series Ar+@B|3→k3,2Ar+*2→ k2,1Ar+ involving the evaporation of a single monomer in each of these successive decays. The metastable decay rates deduced are very different, i.e., k3,2 =45 s−1 and k2,1 =680 s−1 at an ion acceleration voltage of 3 kV. Moreover, the metastable decay rates of Ar+@B|3 exhibit a strong dependence on time elapsed since electron impact production of the Ar+3, and on ion production parameters (i.e., size and internal excitation energy of the neutral precursor). For instance photodissociation (with visible laser light) of the neutral cluster beam leads to a dramatic increase of the observed metastable reaction rules yielding values of up to 100 000 3−1 in the μs time regime.
    Type of Medium: Electronic Resource
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