ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A Method for simultaneous separation and quantitative analysis of overlapping XPS spectral components originating from two different elements has been developed. The method is based on a detailed theory for electron transport in solids and involves deconvolution of the inelastic spectral background from the surface electron spectra. The method is tested through analysis of model spectra of adsorbate/substrate systems following the Frank-van der Merwe, the Stranski-Krastanow or the Volmer-Weber modes of growth. It is demonstrated that the total amount of adsorbate can be found from one single spectrum with an error of ≤ 10% independent of t he mode of growth. In addition, the method gives information on the structural properties of the adsorbate and its mode of growth, with a resolution of the order of the inelastic mean free path.
Additional Material:
16 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740170808
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