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  • 1
    Electronic Resource
    Electronic Resource
    Identification of the switching field function in vector hysteresis models (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4777-4779 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article deals with a large class of magnetic hysteresis models where bistable elements are the basis of hysteretic behavior. The switching field function characterizes the curves that have to be crossed by the magnetic field vector in order for the bistable elements to switch. This article reports experiments that use observations of the aggregate magnetization to identify the switching field function of the bistable elements in two dimensions. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373156
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  • 2
    Electronic Resource
    Electronic Resource
    CoPt and FePt thin films for high density recording media (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6938-6940 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Highly anisotropic face-centered-tetragonal (fct) CoPt and fct FePt nanoparticles have been prepared and embedded in a C or BN matrix by cosputtering from pure Co50Pt50, BN, and Fe50Pt50, C solid targets using a tandem deposition mode. The as-made films show a disordered face-centered-cubic structure which is magnetically soft and have low coercivity (〈20 Oe). Magnetic hardening occurs after heat treatment at elevated temperatures, which leads to increase in coercivity to values up to 15 kOe at room temperature. The hardening is due to the formation of nanoparticles with the highly anisotropic fct with anisotropy K〉107 erg/cm3. Transmission electron microscope studies showed FePt particles embedded in C matrix with a size increasing from below 3 nm in the as-made state to about 8 nm in the optimum annealed state. These results are very promising and make these materials potential candidates for high-density magnetic recording. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372892
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  • 3
    Electronic Resource
    Electronic Resource
    Room temperature polarized photoreflectance characterization of GaAlAs/InGaAs/GaAs high electron mobility transistor structures including the influence of strain relaxation (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 883-888 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using room temperature photoreflectance (PR) we have characterized the properties of three GaAlAs/InGaAs/GaAs high electron mobility transistor structures with two different well widths fabricated by molecular beam epitaxy on (001) GaAs substrates. The samples were denoted as #1, #2, and #3 with well widths of 140, 160, and 160 Å, respectively. Samples #2 and #3 were grown on substrates with different threading dislocation densities. For the latter two samples the well width exceeds the pseudomorphic limit so that there are some strain relaxation and related misfit dislocations as determined from the x-ray measurements. In order to detect the anisotropic strain of the misfit dislocations related to strain relaxation, the PR measurements were performed for incident light polarized along [110] and [11¯0] directions. Evidence for the influence of the strain relaxation upon the relaxed channel was provided by the observed anisotropy of the polarized PR signal in the InGaAs channel layer. Signals have been observed from every region of the sample, making it possible to evaluate the In and Al compositions, channel width and two-dimensional electron gas density, as well as the properties of the GaAs/GaAlAs multiple quantum well buffer layer. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373751
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  • 4
    Electronic Resource
    Electronic Resource
    Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 280-284 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A detailed piezoreflectance (PzR) study of an Fe-containing silicon carbon nitride crystalline film in the temperature range between 15 and 580 K was performed. From the line shape fit of the PzR spectra, the impurity to band and the direct band-to-band transition energies which are denoted as Ei and Egd, respectively, at various temperatures were accurately determined. The parameters that describe the temperature dependence of Ei and Egd are evaluated and discussed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371856
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  • 5
    Electronic Resource
    Electronic Resource
    Surface photovoltage spectroscopy, photoreflectance, and reflectivity characterization of an InGaAs/GaAs/GaAlAs vertical-cavity surface-emitting laser including temperature dependence (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 37-39 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated an InGaAs/GaAs/GaAlAs vertical-cavity surface-emitting laser using surface photovoltage spectroscopy (SPS) in the temperature range of 15 K〈T〈400 K. For comparison purposes, we have also (a) measured temperature-dependent photoreflectance (PR) and normal-incidence reflectivity (NIR); and (b) calculated the number of photoexcited carriers (PEC), which is related to the SPS signal. The SPS spectra exhibit both the fundamental conduction to heavy-hole (1C–1H) excitonic transition and cavity mode plus a rich interference pattern related to the properties of the mirror stack. The PR data show only the 1C–1H excitonic transition (plus Franz–Keldysh oscillations) while the cavity mode is detected by NIR. The temperature variation of 1C–1H/cavity mode is the same for SPS and PR/SPS and NIR. The SPS interference pattern from the DBRs is in good agreement with the PEC calculation. This experiment demonstrates the considerable potential of SPS for the characterization of these devices. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126869
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  • 6
    Electronic Resource
    Electronic Resource
    Self-field ac losses of a twisted multifilamentary (Bi, Pb)2Sr2Ca2Cu3O10/AgAu tape (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 3983-3985 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Self-field loss measurements at 77 K on a superconducting (Bi, Pb)2Sr2Ca2Cu3O10/AgAu tape with twisted filaments are presented. Using the first- and third-harmonic components of the electric field, the hysteretic losses are separated from the total loss. At peak transport currents less than half the critical current, the hysteretic losses are considerably reduced. However, sizable nonhysteretic losses are also observed. At higher currents, the hysteretic loss increases, dominating the total loss, and is similar to that for an untwisted tape. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126842
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  • 7
    Electronic Resource
    Electronic Resource
    Piezoreflectance study of silicon carbon nitride nanorods (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 2044-2046 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Detailed piezoreflectance (PzR) measurements of quasialigned silicon carbon nitride nanorods in the temperature range between 15 and 400 K were performed. The direct band-to-band transition energies Egd at various temperatures were determined accurately through line shape fit of the experimental PzR spectra. The temperature dependence of Egd is analyzed by the Varshni equation [Y. P. Varshni, Physica, (Amsterdam) 34, 149 (1967)] and an expression containing the Bose–Einstein occupation factor for phonons proposed by L. Viña, S. Logothetidis, and M. Cardona [Phys. Rev. B 30, 1979 (1984)]. The parameters that describe the temperature dependence of Egd are evaluated and discussed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126249
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  • 8
    Electronic Resource
    Electronic Resource
    Automatic feature selection for unsupervised image segmentation (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 1230-1232 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A computational bottleneck is often imposed by the volume of image data generated in disciplines such as remote sensing and medical imaging, especially in situations where automatic analysis or interpretation is required. Segmentation and classification tasks that utilize multivariate data can be impeded by this dimensionality. A general-purpose unsupervised image segmentation system is presented here for the automatic detection of image regions exhibiting different visual texture properties. A suboptimal feature selection procedure is proposed to automatically select the set of texture features best suited for the particular application. Results are presented for the segmentation of ground-penetrating radar images for generating automatic subsurface reports. The reduction in the size of the feature set both reduces the computation time and improves the accuracy. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1289267
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  • 9
    Electronic Resource
    Electronic Resource
    Nondestructive Determination of Moisture and Sodium Chloride in Cured Atlantic Salmon (Salmo salar) (Teijin) Using Short-wavelength Near-infrared Spectroscopy (SW-NIR) (2003)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of food science 68 (2003), S. 0 
    Details
    ISSN: 1750-3841
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Process Engineering, Biotechnology, Nutrition Technology
    Notes: : Moisture (49.70 to 74.20% w/w) and salt (0.13 to 12.30% w/w) concentrations in cured Atlantic salmon (Salmo salar) or teijin were determined by short-wavelength near-infrared (SW-NIR) reflectance spectroscopy (600 to 1100 nm) using partial least square regression (PLS) and artificial neural networks (ANN) calibration methods. ANN and PLS yielded similar results (Salt: ANN RMS = 1.43% w/w, PLS RMS = 1.37% w/w; Water, ANN RMS = 2.08% w/w, PLS RMS = 2.04% w/w). Sampling the dorsal or ventral portion of the fish did not appear to affect the prediction error of the salt or moisture models.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-2621.2003.tb05698.x
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  • 10
    Electronic Resource
    Electronic Resource
    Evaluation of Information Loss in Digital Elevation Models With Digital Photogrammetric Systems (2000)
    Oxford, UK : Blackwell Publishing Ltd
    The @photogrammetric record 16 (2000), S. 0 
    Details
    ISSN: 1477-9730
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Architecture, Civil Engineering, Surveying
    Notes: Information loss is caused when a surface is sampled with a finite interval, such as in the production of a digital elevation model (DEM). This information loss can become the dominant part of the error in a DEM. The ability to quantify information loss enables guidance to be provided for an appropriate choice of grid interval and better accuracy assessment for the DEM. With the use of digital photogrammetric systems, evaluation of information loss has become much easier. This paper describes three methods of evaluating information loss. An example is given of the method which is most appropriate for use with a digital photogrammetric system, based on rock cliff surface data and the VirtuoZo system.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/0031-868X.00151
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