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  • Articles: DFG German National Licenses  (3)
  • 1995-1999  (3)
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  • Articles: DFG German National Licenses  (3)
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Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3368-3368 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and operation of an imaging beamline at the Advanced Light Source used for providing diagnostic information on the electron beam for the accelerator and experimental groups is described. This system is based on a Kirkpatrick-Baez mirror pair and utilizes a carbon filter to give a bandpass in the soft x-ray region. The focused x-rays are viewed on a single-crystal scintillator through an optical microscope and the image recorded on a CCD camera. This system, together with other instruments to evaluate beam size, stability, and other time-dependent information, is described, data are presented, and the operation of the overall beamline is evaluated. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A beamline for macromolecular crystallography has been designed for the ALS. The source will be a 37-pole wiggler with a 2-T on-axis peak field. The wiggler will illuminate three beamlines, each accepting 3 mrad of horizontal aperture. The central beamline will primarily be used for multiple-wavelength anomalous dispersion measurements in the wavelength range from 4 to 0.9 A(ring). The beamline optics will comprise a double-crystal monochromator with a collimating premirror and a double-focusing mirror after the monochromator. The two side stations will be used for fixed-wavelength experiments within the wavelength range from 1.5 to 0.95 A(ring). The optics will consist of a conventional vertically focusing cylindrical mirror followed by an asymmetrically cut curved-crystal monochromator. This paper presents details of the optimization of the wiggler source for crystallography, gives a description of the beamline configuration, and discusses the reasons for the choices made. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1480-1482 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Using a newly developed reflectometer we have measured the reflectivity at the silicon K edge for different silicon compounds. Combining these measurements with silicon L edge reflectivity measurements carried out on a different reflectometer we determined the binding energy of core excitons at the L edge. The results show that it is possible to carry out reflectivity measurements with the resolution necessary for the determination of the exciton parameters. Comparison with literature values shows that a rigid Kramers–Kronig analysis is not needed when the angle of incidence is well below the critical angle of total external reflection. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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