ISSN:
0049-8246
Schlagwort(e):
Chemistry
;
Analytical Chemistry and Spectroscopy
Quelle:
Wiley InterScience Backfile Collection 1832-2000
Thema:
Physik
Notizen:
K x-ray production cross-sections of Ag, Sn and Te by 32-80 MeV 32S ions have been measured. The dependence of target K x-ray yields on the target thickness was found to be negligible in the S (64 MeV) + Ag collision system. The experimental data are compared with some theoretical predictions.
Zusätzliches Material:
1 Ill.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1002/xrs.1300120410
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