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K x-ray production cross-sections of Ag, Sn and Te by 32-80 MeV 32S ions (1983)

Bǎdicǎ, T. ; Ciortea, C. ; Petrovici, A. ; [et al.]

New York, NY [u.a.] : Wiley-Blackwell

X-Ray Spectrometry 12 (1983), S. 173-174

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ISSN: 0049-8246

Keywords: Chemistry ; Analytical Chemistry and Spectroscopy

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: K x-ray production cross-sections of Ag, Sn and Te by 32-80 MeV 32S ions have been measured. The dependence of target K x-ray yields on the target thickness was found to be negligible in the S (64 MeV) + Ag collision system. The experimental data are compared with some theoretical predictions.

Additional Material: 1 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/xrs.1300120410

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