ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The methods described by DeVries and Tuft [1] for revealing inhomogeneities in diamonds by applying xerographic techniques to their polished surfaces have been developed and tested on a small suite of diamonds known to cover a wide range of impurity-dependent properties. These specimens had all been characterised by one or more of the following methods: infra-red absorption, bi-refringence, ultra-violet absorption topography, X-ray topography and cathodoluminescence topography. In general the charge pattern, as revealed by retention of a superficial deposit of a fine powder, could be correlated well with known inhomogeneities outcropping at the specimen surface. In one case, however, the dust pattern disclosed unsuspected zones of low-level radiation damage in a specimen that had been irradiated by a supposedly well-collimated proton beam.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01113571
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