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  • Articles: DFG German National Licenses  (2)
  • 68.35.Bs  (1)
  • Extrapancreatic action  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Three different classes of oral antidiabetic drugs do not increase insulin binding and insulin-inducedRNA synthesis in human fibroblast cultures (1985)
    Springer
    Research in experimental medicine 185 (1985), S. 45-49 
    Details
    ISSN: 1433-8580
    Keywords: Oral antidiabetic drugs ; Extrapancreatic action ; Cultured fibroblasts ; Insulin receptor ; RNA synthesis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Summary We describe insulin binding and insulin-mediated RNA synthesis on seven human fibroblasts strains in culture initiated from skin biopsies in the presence of three oral antidiabetic agents, Metformin, Gliquidone, and a non-sulfonylurea antidiabetic drug (B × DF 591 ZW), which belong to different chemical classes. At least at a nontoxic pharmacologic concentration of 1 µg/ml these drugs did not influence the number and affinity of insulin receptors, nor did they increase the insulin-mediated RNA synthesis. We conclude that cultured fibroblasts do not represent the proper target for an evaluation of an extrapancreatic action of oral antidiabetic drugs.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01851526
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Scanning capacitance microscopy and spectroscopy applied to local charge modifications and characterization of nitride-oxide-silicon heterostructures (1995)
    Springer
    Applied physics 61 (1995), S. 357-362 
    Details
    ISSN: 1432-0630
    Keywords: 61.16.Ch ; 73.40.Qv ; 73.90.+f ; 68.35.Bs
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract We have combined a home-built capacitance sensor with a commercial scanning force microscope to obtain a Scanning Capacitance Microscope (SCM). The SCM has been used to study Nitride-Oxide-Silicon (NOS) heterostructures which offer potential applications in charge storage technology. Charge writing and reading on a submicrometer scale is demonstrated with our SCM setup. In addition, SCM appears to be very useful for the characterization of subsurface defects in semiconductor devices which are inaccessible by most of the other scanning probe microscopies. Finally, we introduce a novel spectroscopic mode of SCM operation which offers combined voltage-dependent and spatially resolved information about inhomogeneous charge distributions in semiconductor devices.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01540108
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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