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  • Articles: DFG German National Licenses  (2)
  • Cross-sectional TEM sample preparation  (1)
  • Life and Medical Sciences  (1)
  • plates and tubes  (1)
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  • Articles: DFG German National Licenses  (2)
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Years
  • 1
    ISSN: 1573-4862
    Keywords: Magnetic field perturbation ; circular and elliptical flaws ; SQUID magnetometers ; background cancellation ; plates and tubes
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Mathematics
    Notes: Abstract A SQUID magnetometer can be used to measure the magnetic field produced by flaws in a two-dimensional, conducting plate carrying a current. Identification of the flaw-induced magnetic field is difficult because of the large magnetic field associated with the edges of the plate and the current in the leads that connect the plate to the power supply. We have developed a technique by which the wire and edge fields can be cancelled prior to mapping the magnetic field. In this technique, a similar unflawed conducting sheet is placed adjacent to the flawed plate, with a connection between the sheet and the plate at one edge, and with the opposite edges of the sheet and of the plate connected to the two conductors of a coaxial cable. Thus, an applied current will flow along one conductor of the cable, across the cancelling sheet, cross into the flawed plate, return along the plate, and then return to the power supply along the other conductor of the coaxial cable. As a result of this geometry, there is no magnetic field from the lead-in wires because they are coaxial, and the magnetic field due to the edges of the plate is cancelled by the opposing magnetic field of the edges in the adjacent sheet. The extent of cancellation is determined primarily by the separation between the plate and the cancelling sheet, by the thickness of the plate, and by macroscopic inhomogeneities in their electrical conductivities.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Microscopy Research and Technique 26 (1993), S. 157-161 
    ISSN: 1059-910X
    Keywords: Cross-sectional TEM sample preparation ; Quantum wire (QWR) structures ; Lithography ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: A novel cross-sectional sample preparation technique for quantum wire (QWR) structures is described. By coating a thin layer of Au with a designed pattern on the sample as a marker to indicate the position of the wire pattern, the location of the thinned area can be controlled precisely. An example of applying this technique to an InGaAs/GaAs QWR structure is demonstrated. This technique can also be applied to any other small dimensional structures or devices with specific regions of interest. © Wiley-Liss, Inc.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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