ISSN:
1573-0727
Keywords:
bounded fault
;
deterministic test
;
Markov chain
;
RAM
;
random test
;
test length
;
testing
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract We study the class of ”bounded faults” in random-access memories;these are faults that involve a bounded number of cells. This is avery general class of memory faults that includes, for example, theusual stuck-at, coupling, and pattern-sensitive faults, but also manyother types of faults. Some bounded faults are known to requiredeterministic tests of length proportional to n log2 n, where nis the total number of memory cells. The main result of this paper isthat, for any bounded fault satisfying certain very mild conditions,the random test length required for a given level of confidence isalways O(n).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1008263507929
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