ISSN:
1433-075X
Keywords:
Key words Atomic force microscopy
;
Polar-surface
;
Silver iodide
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Atomic Force Microscopy is used to determine the crystallographic polarity of the surfaces of β-AgI single crystals. The studies reveal that the hexagonal packed Ag+ plane is the (001) and the I– plane is the (001–). This observation is also consistent with the earlier x-ray diffraction measurements and chemical etching techniques as well as the polarizability and electronegativity of the ions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s100190050040
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