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  • 11
    Electronic Resource
    Electronic Resource
    Springer
    Semigroup forum 9 (1974), S. 261-270 
    ISSN: 1432-2137
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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  • 12
    Electronic Resource
    Electronic Resource
    Springer
    Semigroup forum 11 (1975), S. 185-188 
    ISSN: 1432-2137
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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  • 13
    Electronic Resource
    Electronic Resource
    Springer
    Semigroup forum 14 (1977), S. 69-79 
    ISSN: 1432-2137
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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  • 14
    Electronic Resource
    Electronic Resource
    Springer
    European journal of clinical pharmacology 34 (1988), S. 299-301 
    ISSN: 1432-1041
    Keywords: ischaemic heart disease ; alprenolol ; long-term treatment ; serum magnesium ; serum calcium ; parathyroid hormone
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Medicine
    Notes: Summary In 40 patients with ischaemic heart disease the serum levels of magnesium, parathyroid hormone (PTH), phosphate, calcium, and ionized calcium remained unchanged and within normal limits following treatment for 12 months with alprenolol (n=20) or placebo (n=20). No changes occurred during a 2 week withdrawal period. The clinical implication is that the non-cardioselective betablocker alprenolol can be given to patients with ischaemic heart disease without the risk of inducing potentially cardiotoxic disturbances in serum magnesium and serum calcium levels. Whether this applies to cardioselective beta-blockers remains to be established.
    Type of Medium: Electronic Resource
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  • 15
    ISSN: 1432-1041
    Keywords: alprenolol ; coronary heart disease ; platelet aggregation ; fibrinolysis ; platelet serotonin release ; exercise
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Medicine
    Notes: Summary In 14 patients with coronary heart disease the effect of long-term treatment (mean 16 months, range 12–33) with alprenolol on platelet function and fibrinolytic activity was studied. While on the beta-blocker and two weeks after gradula withdrawal of it, the patients performed a bicycle-ergometer test and blood samples were obtained before and following exercise. Pre-exercise fibrinolytic activity, assessed by the euglobulin clot lysis time, was 183±27 min (mean ± SEM) while on alprenolol as compared to 111±18 min (p〈0.01) after its withdrawal. Activation of fibrinolysis following exercise was not significantly influenced by alprenolol. In patients treated with alprenolol, the pre-exercise threshold level of ADP, producing platelet aggregation was 3.3 µM (geometric mean) and 5.1 µM after stopping treatment (p≤0.05). In patients receiving the beta-blocker, the ADP- threshold value dropped from 3.3 µM before exercise to 2.3 µM immediately after exercise (not significant). The corresponding values after withdrawal of alprenolol were 5.1 µM and 2.7 µM (p≤0.02). Adrenaline — stimulated aggregation was not significantly influenced by alprenolol. Serotonin release from platelets following maximal ADP- and adrenaline stimuli was not significantly changed by exercise in patients on beta-blockade. After stopping treatment, ADP-induced serotonin release was 22±4.1% before and 15±4.7% after exercise (p〈0.02). The corresponding values using the adrenaline stimulus were 29±5.7% and 17±4.7% (p〈0.05). It is suggested that during physical stress alprenolol may protect platelets against aggregatory stimuli.
    Type of Medium: Electronic Resource
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  • 16
    Electronic Resource
    Electronic Resource
    Springer
    Acta mathematica hungarica 47 (1986), S. 299-312 
    ISSN: 1588-2632
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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  • 17
    Electronic Resource
    Electronic Resource
    Springer
    International journal of parallel programming 10 (1981), S. 331-340 
    ISSN: 1573-7640
    Keywords: Markov DTOL systems ; cut-point ; stochastic grammars ; probabilistic grammars ; language family ; collection of language families ; dense hierarchy ; accumulation point
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Notes: Abstract Letp satisfy 0 ⩽p 〈 1, then by ℳ(p) we denote the family of Markov DTOL languages with cut pointp. In this paper we present a complete classification of the collection ℳ of such families ℳ(p), 0 ⩽p 〈 1, showing that ℳ forms an infinite nondense hierarchy with ℳ(0) being its only accumulation point from below. Furthermore it is proved that each language in ℳ(p) can be expressed as a finite union of DDTOL languages.
    Type of Medium: Electronic Resource
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  • 18
    Electronic Resource
    Electronic Resource
    Springer
    International journal of parallel programming 14 (1985), S. 35-49 
    ISSN: 1573-7640
    Keywords: Systolic tree ; syntactic monoid ; formal languages
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Notes: Abstract The acceptance of regular languages by systolic tree automata is analyzed in more detail by investigating the structure of the individual processors needed. Since the processors essentially compute the monoid product, our investigation leads to questions concerning syntactic monoids. Hereby certain properties of monoids turn out to be important. These properties, as well as the language families induced by them, are also studied in the paper.
    Type of Medium: Electronic Resource
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  • 19
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 3 (1992), S. 219-234 
    ISSN: 1573-0727
    Keywords: Diagnosis ; fault models ; Markov chains ; random testing ; sequential machines
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract A mathematical framework for the testing and diagnosis of sequential machines is developed. A very general fault model is used in which a faulty machine is represented as a sequential machine, possibly with state and output sets different from those of the good machine. A deterministic finite automaton, called observer, describes the process by which one gains information from the observation of the responses to test sequences. It generalizes the work of Hennie on distinguishing and homing sequences, by modelling all the possible conclusions that could be drawn from observing the circuit under test. A nondeterministic acceptor is derived from the observer; it accepts diagnosing sequences and can also be used to generate test sequences. We then associate probabilities with this nondeterministic acceptor which, together with a stochastic source of input symbols, provides a probabilistic diagnoser. As a particular application we consider the testing and diagnosis of random-access memories by random test sequences. Our model generalizes the work by David et al. on the calculation of the length of a random test sequence required to guarantee that the probability of detection of a fault exceeds a prescribed threshold.
    Type of Medium: Electronic Resource
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  • 20
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 10 (1997), S. 197-214 
    ISSN: 1573-0727
    Keywords: bounded fault ; deterministic test ; Markov chain ; RAM ; random test ; test length ; testing
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract We study the class of ”bounded faults” in random-access memories;these are faults that involve a bounded number of cells. This is avery general class of memory faults that includes, for example, theusual stuck-at, coupling, and pattern-sensitive faults, but also manyother types of faults. Some bounded faults are known to requiredeterministic tests of length proportional to n log2 n, where nis the total number of memory cells. The main result of this paper isthat, for any bounded fault satisfying certain very mild conditions,the random test length required for a given level of confidence isalways O(n).
    Type of Medium: Electronic Resource
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