ISSN:
1432-0630
Keywords:
61.16.Ch
;
75.60.Ch
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract We present domain wall images obtained by using Magnetic Force Microscope (MFM) on magnetic samples like: double layer of permalloy alloy, magnetic hard disk, BaFe12O19 single crystal and YGdTmGa/YSmTmGa magnetic garnet. We have imaged topography and magnetic forces of the same area. The Fe double- and single-layer thin film tips have been prepared to achieve high sensitivity (10−12N) and high resolution of MFM.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00348421
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