Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
10 (1981), S. 28-30
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
An improved version of the LAMA program for the quantitative analysis of composition and mass thickness of thin film materials by X-ray fluorescence (XRF) has been developed. The divergence and slow convergence problems occasionally experienced with the LAMA-1 program have been eliminated by using the linear approximation method and the algorithm of simultaneous refinement of composition and thickness to greatly increase its capability and performance. A study of over a hundred simulated thin films showed that the LAMA-2 program converged much faster than LAMA-1 and gave better accuracy. The efficiency of the program has been improved to the point where it is feasible to operate on a minicomputer.
Additional Material:
2 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300100108
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