Library

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • Electronic Resource  (2)
  • 1985-1989  (2)
  • 1989  (2)
Material
  • Electronic Resource  (2)
Years
  • 1985-1989  (2)
Year
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of low temperature physics 74 (1989), S. 215-229 
    ISSN: 1573-7357
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract We have studied the electric behavior of phase-slip centers in superconducting indium microbridges of 0.9 µm thickness, 3–4 µm width, and 70–130 µm length. Our measurements were performed in the temperature range 3–10 mK below the critical temperature Tc resulting in relatively large values (about 10–20 µm) of the quasiparticle diffusion length. The temperature dependent Ginzburg-Landau coherence length ξ(T) has been determined for all samples from the measured temperature dependence of the critical current density. The fabrication of two notches in the indium bridge has been found to localize reliably the nucleation site of the first two phase-slip centers. Our measurements quantitatively confirmed the dc interaction predicted by the model of Kadin, Smith, and Skocpol. In addition, for temperatures very close toT c , an ac interaction has been observed which disappears abruptly for decreasing temperature. No voltage coupling has been detected.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
  • 2
    ISSN: 1434-6036
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Low-temperature scanning electron microscopy has been performed for imaging the spatial distribution of the critical current densityj c(x,y) and of the critical temperatureT c(x,y) in polycrystalline superconducting YBaCuO films. Strongly inhomogeneous behavior has been observed, and the spatial resolution limit has been found to be 1–2 μm. The local temperature increment in the specimen film caused by the electron beam scanning has been demonstrated experimentally as the underlying mechanism of the imaging principle, and the beam-induced thermal perturbation of the high-T c film/substrate configuration is discussed in detail. The radiation hardness of the sample films against the electron beam irradiation in our imaging experiments has been evaluated. No radiation damage could be detected up to the maximum applied dose of well above 1020 electrons/cm2 for a typical beam energy of 26 keV.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...