ISSN:
1432-0630
Keywords:
PACS: 78.70.Bj; 61.80.-x
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
+ and O+ ions was exposed to positron beams to measure the positron annihilation Doppler broadening as a function of the positron energy. As in the previous case of O+-irradiated semicrystalline PEEK, the annihilation lines recorded at relatively low positron energies became broader with increasing irradiation dose. The thickness of the damaged layer estimated from the positron data was compared with the mean depth of the implanted ions calculated by the TRIM code. For the Au+-irradiated samples, some discrepancy was observed between the two quantities.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003390050507
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