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  • Electronic Resource  (1)
  • 2010-2014
  • 1975-1979  (1)
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  • Electronic Resource  (1)
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    Electronic Resource
    Electronic Resource
    Optical measurements of stress distributions in GaAs at low temperature (1975)
    Springer
    Applied physics 8 (1975), S. 47-49 
    Details
    ISSN: 1432-0630
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract We have measured the stress distribution at He temperature on two epitaxial GaAs wafers which were compressed along one edge. The stress was determined non-destructively at different points on the wafer surface by using the line-splitting and the lineshifts of the photoluminescence spectra of the acceptor-bound excitons in comparison with calibration spectra at known uniaxial stress.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00883669
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