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  • Electronic Resource  (13)
  • 2000-2004  (8)
  • 1965-1969  (5)
  • 1
    Electronic Resource
    Electronic Resource
    Texture transformations in reactive metal films deposited upon amorphous substrates (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 2635-2640 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present results that demonstrate how interfacial reactions between a metal film and substrate during deposition affect microstructural evolution. In particular, we investigate Ti films deposited on amorphous SiO2 using ultrahigh vacuum transmission electron microscopy. Ti films were deposited in situ at room temperature and were examined using Auger electron spectroscopy and transmission electron microscopy. An initial [hk0] preferred orientation developed in films up to 2.5 nm in thickness. Films between 2.5 and 5.0 nm developed a [001] preferred orientation that persisted in films up to 20.0 nm thick. These data, in conjunction with Auger electron spectra and dark-field microscopy, suggest that growth of Ti films on SiO2 is directly affected by reactions at the Ti/SiO2 interface and that this reaction is responsible for the observed change in preferred orientation. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1337078
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  • 2
    Electronic Resource
    Electronic Resource
    Evolution of nanoscale texture in ultrathin TiN films (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 2223-2225 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigate the evolution of texture and grain morphology in fine-grained TiN thin films using cross correlation of dark-field images obtained using annular objective apertures with radii that correspond to different low index TiN reflections. This technique enables parallel analyses of the orientations of thousands of grains, with a spatial resolution of order 10 nm. Preferred grain orientations were determined for 40 and 100 nm thick TiN layers grown on SiO2 by magnetically unbalanced reactive magnetron sputter deposition. We find that no single orientation is dominant in the 40 nm films but that a 〈100〉 texture has developed by the time these films reach 100 nm in thickness. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1360235
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  • 3
    Electronic Resource
    Electronic Resource
    Nanoscale characterization of stresses in semiconductor devices by quantitative electron diffraction (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 412-414 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: By using transmission electron microscopy and focused ion beam technology in conjunction with finite element and electron diffraction contrast simulations, we have been able to quantitatively measure stresses in semiconductor devices with a spatial resolution on the order of tens of nanometers and a sensitivity on the order of tens of mega pascals. Examples of measuring stresses around shallow isolation trenches in semiconductor device structures are presented. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126993
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  • 4
    Electronic Resource
    Electronic Resource
    Deep submicron microcontact printing on planar and curved substrates utilizing focused ion beam fabricated printheads (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 981-983 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Focused ion beam (FIB) fabrication of nanostructured "printheads" is used to extend applications of microcontact printing. Planar and curved printheads are fabricated with feature sizes less than 100 nm over fields of view of order 1 mm2, and transferred to target substrates with spatial resolution of order 200 nm. Analysis of the mechanical and ion optical stabilities of the FIB demonstrates that several hours of printhead fabrication time are possible with nanoscale precision. The rapid prototyping capability of this approach and the large depth of focus in the FIB enable rapid nanoscale patterning of a wide range of surface geometries. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1348308
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  • 5
    Electronic Resource
    Electronic Resource
    THE SIGNIFICANCE OF SIMIAN VIRUSES TO THE MONKEY COLONY AND THE LABORATORY INVESTIGATOR (1969)
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 162 (1969), S. 0 
    Details
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1749-6632.1969.tb56398.x
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  • 6
    Electronic Resource
    Electronic Resource
    IN VIVO AND IN VITRO INHIBITION OF HEPATITIS VIRUSES BY STREPTOTHRICIN (1965)
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 130 (1965), S. 0 
    Details
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1749-6632.1965.tb12569.x
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  • 7
    Electronic Resource
    Electronic Resource
    Quantitative three-dimensional reconstruction of geometrically complex structures with nanoscale resolution (2002)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 330-334 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A technique to reconstruct high resolution three-dimensional structural images and chemical maps of geometrically complex features is presented. A focused ion beam microscope is used to collect secondary electron images and secondary ion mass spectroscopy elemental maps as a function of depth in the sample. These images and elemental maps are then used to reconstruct volume images and chemical maps using shape-based interpolative methods with 25 nm lateral resolution and approximately 10 nm depth resolution. From these reconstructions, fundamental parameters such as connectivity, the volume fraction, and surface areas of features of interest can be calculated directly. These techniques open broad new opportunities for understanding three-dimensional structural and chemical relationships in materials research. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1430550
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  • 8
    Electronic Resource
    Electronic Resource
    The Spray Warning Scheme for Control of Sugar Beet Yellows in England Summary of Results between 1959–66 (1968)
    Oxford, UK : Blackwell Publishing Ltd
    Plant pathology 17 (1968), S. 0 
    Details
    ISSN: 1365-3059
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Notes: Sugar beet growers in England have been advised since 1959 to spray their crops with systemic insecticide to control spread of yellows viruses when infestation with the vector aphids (mainly Myzus persicae Sulz.) in May and June reaches 0.25 aphids/plant. The data collected up to 1966 show that aphid infestation at any one time is not proportionally related to eventual yellows incidence. Graphs of mean aphid infestation and yellows incidence in different areas are presented, which are a guide to issuing spray warnings.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-3059.1968.tb00406.x
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  • 9
    Electronic Resource
    Electronic Resource
    VIRUS DISEASES OF SWEET PEAS IN ENGLAND (1965)
    Oxford, UK : Blackwell Publishing Ltd
    Plant pathology 14 (1965), S. 0 
    Details
    ISSN: 1365-3059
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-3059.1965.tb00301.x
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  • 10
    Electronic Resource
    Electronic Resource
    Mycoplasma-like Bodies associated with Sandal Spike Disease (1969)
    [s.l.] : Nature Publishing Group
    Nature 224 (1969), S. 1121-1122 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] Leaves were taken from 20 year old, healthy and spike-infected (rosette-type) sandal trees collected from two plantations near Bangalore. Sap from infected leaves which was examined in the electron microscope (Siemens Elmiskop IA calibrated with catalase crystals18) using the crude preparation ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/2241121a0
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