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  • Electronic Resource  (4)
  • 1995-1999  (1)
  • 1990-1994  (3)
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  • Electronic Resource  (4)
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  • 1995-1999  (1)
  • 1990-1994  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    Refractive index and elastic properties of single-crystal corundum (α-Al2O3) up to 2100 K (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 772-776 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We show that Brillouin scattering can be used to measure the elastic and optical properties of materials to very high temperatures. We have measured the elastic constants C11, C33, and C44 of single-crystal sapphire in the temperature range 300–2100 K extending by 300 K the highest temperature previously attained with ultrasonic resonance techniques. The temperature dependence of the ordinary and extraordinary refractive indices no and ne in the same temperature range have been obtained for the first time. Although both no and ne are temperature dependent, the ratio no/ne is found to be almost temperature independent.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.349633
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    The elastic and electromechanical properties of tetragonal BaTiO3 single crystals (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 7327-7332 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: From velocity of sound measurements, obtained using Brillouin scattering and ultrasound techniques, the elastic and piezoelectric constants at room temperature have been determined on high-quality monodomain tetragonal BaTiO3 single crystals. The elastic constants are in fair agreement with those measured previously by the low-frequency equivalent circuit method. However, the electromechanical properties are significantly different. It is suggested that high frequency relaxation may have an influence on the measurements of those parameters.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.349751
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Elastic constants of boron nitride (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 832-834 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using Brillouin scattering the three independent elastic stiffness constants cij of single-crystal cubic boron nitride have been measured: c11=820, c12=190, and c44=480 GPa. The resulting bulk modulus, 400 GPa, is in reasonable agreement with two independent determinations obtained from x-ray measurements in a diamond anvil cell. Using the bulk modulus it is found that the x-ray results are best fitted with a value of dB/dP=3.0.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357757
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Advantages of ultraviolet Raman scattering for high temperature investigations (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 1-3 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We show that UV Raman spectroscopy is eminently well suited for the in situ investigation of samples at high temperatures. Using sapphire as a test material, we have recorded Raman spectra from ambient temperature to 1700 K using different excitation wavelengths, both in the visible and near UV region of the spectrum. These spectra show that, because of the very rapid decrease of blackbody radiation in the short wavelength region, Raman spectra recorded in the near UV region of the spectrum are free from the blackbody radiation background, which typically hampers experiments in the visible. With 266 nm exciting radiation, we observe no thermal background even at 1700 K. We foresee that the method will become a powerful tool for in situ investigations of high-temperature materials. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121437
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