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  • Electronic Resource  (4)
  • 1990-1994  (4)
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  • Electronic Resource  (4)
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  • 1
    Electronic Resource
    Electronic Resource
    Improved differential heterodyne interferometer for atomic force microscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3697-3701 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A highly sensitive displacement sensor for atomic force microscopy is described which enables one to measure the relative displacement of the tip from a sample surface. The sensor is based on the differential heterodyne interferometer formed between the reflections from the microscope cantilever backside and the sample surface. As a result of using an optical common-path construction, the sensor is essentially insensitive to the mechanical vibration, and achieves high stability at low frequencies, even though there are certain restrictions imposed by the reflection from the examined surface and the variable deflection mode. Images are presented demonstrating the atomic resolution of mica and graphite. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144494
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Shape of the cantilever deflection for the atomic force microscope in force curve measurements (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1930-1934 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The lateral force induces a torsional motion in the cantilever for an atomic force microscope. This phenomenon affects not only the surface image but also the force curve. The two-dimensional deflections of the cantilever under several force curve measurement conditions are investigated using the heterodyne interferometer. In most cases, the deflection agrees well with that obtained theoretically from linear static analysis. At some points on a rough sample surface, undesirable behaviors are seen in both force curve and two-dimensional deflection of the cantilever. The relation between the force curve and the deflection of the cantilever is investigated in detail experimentally and theoretically.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144844
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Magnetic scattering of conduction carriers in 3d transition-metal intercalates of M x TiS2 (M=Mn, Fe, Co, and Ni) (1990)
    Springer
    Journal of low temperature physics 78 (1990), S. 141-154 
    Details
    ISSN: 1573-7357
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Galvanomagnetic measurements on layer-structured 3d transition-metal intercalates of MxTiS2 (M = Mn, Fe, Co, and Ni;x≤0.33) have been made over the temperature range 0.34–20 K. Resistivity minima and negative magneto-resistances are observed for paramagnetic Mn, Fe, and Ni intercalates with low guest concentrations (x≤0.1), as found in well-known dilute alloys. However, in the case of the weak-ferromagnetic phase of CoxTiS2 (0.10≤x≤0.33) with the Curie temperatureT c =120–140 K, such anomalous behaviors are also observed, which is not commonly found in the magnetically ordered phases of various magnetic materials. With these data we have given qualitative discussions on the magnetic scattering process of conduction carriers. Further, some of the experimental results are discussed in connection with the band calculations for M1/3TiS2.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00682113
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  • 4
    Electronic Resource
    Electronic Resource
    Low temperature specific heat of intercalation compounds M x TiS2 (M = 3d transition metals) (1994)
    Springer
    Journal of low temperature physics 97 (1994), S. 335-345 
    Details
    ISSN: 1573-7357
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Specific heats of intercalation compounds Fex TiS2 (x = 0–1/3) and M1/4 TiS2 (M = Mn, Fe, Co and Ni) have been measured in the temperature range 0.35–5 K using an ac calorimetry method. The temperature dependence of the specific heats for these materials is written as the sum of electronic, lattice and anomalous terms. The anomalous specific heats show a Schottky type behavior, which is due to a very small amount of localized 3d atoms with crystal-field splittings, but the remaining majority of the intercalated guest 3d atoms are regarded as having itinerant electron character that contributes to the enhancement of the density of states at the Fermi energy or of electronic specific heat coefficient.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00752922
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    Paper (German National Licenses)
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