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  • Electronic Resource  (2)
  • 74.70  (1)
  • PACS: 42.60; 81.60  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 63 (1996), S. 337-339 
    ISSN: 1432-0630
    Keywords: PACS: 42.60; 81.60
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract.  Surface topology changes in polyimide induced by single UV-laser pulses with pulse durations between 140 ns and 5 μs are investigated by means of atomic force microscopy. With increasing fluence three different regimes are found: (a) real material removal (ablation), (b) swelling of the irradiated area above the level of the untreated surface (hump formation) and (c) lowering of the irradiated area below the level of the untreated surface (dent formation). A detailed description of these topology changes is given and different formation processes are discussed.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1432-0630
    Keywords: 81.152 ; 68.55 ; 74.70
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract High-quality Bi2Sr2CaCu2O8 (BSCCO) films were grown by means of pulsed-laser deposition on 10° off-axis oriented (001) SrTiO3 substrates. The films exhibit a step-like morphology and they are properly oriented along the (001) direction. Their normal-state resistivity measured along the tilt (off-axis (100) direction of the substrate) was, typically, 260 times higher than that along the (010) direction. Such films reveal a transverse Seebeck-effect which significantly exceeds that observed with YBa2Cu3O7 (YBCO).
    Type of Medium: Electronic Resource
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