ISSN:
1572-8870
Keywords:
Poly(dimethylsiloxane)-polystyrene block copolymers
;
polymer blends
;
X-ray photoelectron spectroscopy
;
contact angles
;
time-of-flight secondary ion mass spectrometry
;
surface segregation
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract The surface composition of polystyrene blends containing poly(dimethylsiloxane)-polystyrene block copolymers have been analyzed using X-ray photoelectron spectroscopy (XPS), contact angle measurements, and time-of-flight secondary ion mass spectrometry (TOFSIMS). The three techniques showed the surface of the blend samples to be identical to pure poly(dimethylsiloxane) homopolymer, despite the fact that the systems each contained only a 2% bulk concentration of siloxane. The high surface sensitivity of TOFSIMS—which probes the samples to depths of a few angstroms—indicates an enrichment of-Si(CH3)3 groups at the surface. These are the terminal groups of the PDMS part of the block. Their enrichment at the surface of the samples is presumably due to their low surface energy, in addition to the tendency for end groups to be at the surface due to free volume considerations.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00684030
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