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XRF induced by PIXE: Comparison with radioisotope XRF (1987)

Al-Saleh, K. A. ; Meyer, J. D. ; Saleh, N. S.

Springer

Applied physics 42 (1987), S. 327-329

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ISSN: 1432-0630

Keywords: 79.20

Source: Springer Online Journal Archives 1860-2000

Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics

Notes: Abstract XRF induced by PIXE (XRF-PIXE) using silver as a primary target was compared with a standard radioisotope XRF system using Cd-109 as a primary exciting source, for the analysis of single-element thin standards. The sensitivity of the two methods were determined for elements from Cl to Mo. XRF is found to be more sensitive for elements from Cl to Mn, whereas XRF-PIXE is found to be more suitable for elements from Fe to Mo. Both techniques can be considered as complementary to each other.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF00616571

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