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  • 1985-1989  (1)
  • 1986  (1)
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  • 1985-1989  (1)
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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 3543-3548 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: X-ray structures and magnetic properties of sputtered osmium-doped iron oxide thin films prepared under various deposition conditions have been analyzed by x-ray diffraction and vibrating sample magnetometer techniques. Results show that the crystalline phase, macrostain, and grain size play important roles in the coercivity Hc, saturation magnetization 4πMs, and squareness S* of the films. Ferrimagnetic γ-Fe2O3 and/or α-Fe of 400-A(ring) grain size or less were mainly responsible for the good coercivities and magnetizations of the films, i.e., Hc=700–1000 Oe and 4πMs=4000–6000 G. A film which contained appreciable antiferromagnetic α-Fe2O3 phase had much lower Hc(=130 Oe) and 4πMs(=1000 G). Correlation between macrostrain εn, and S* has been observed where the film with large compressive strains had low S*=0.69, and those with little or zero εn gave good squareness S*=0.79–0.81.
    Type of Medium: Electronic Resource
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