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  • 1990-1994  (2)
  • 1985-1989  (4)
  • 1955-1959
  • 1990  (2)
  • 1987  (4)
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  • 1990-1994  (2)
  • 1985-1989  (4)
  • 1955-1959
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  • 1
    Electronic Resource
    Electronic Resource
    Dynamic observation of magnetic domains in amorphous ferromagnetic ribbons driven at line frequencies (1987)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 51 (1987), S. 376-377 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The recently developed dynamic observation technique of R. Shimizu and T. Ikuta [Appl. Phys. Lett. 44, 811 (1984)] for scanning electron microscopy, "line-sampling stroboscopy,'' was used for the observation of magnetic domains in an amorphous ferromagnetic ribbon. The image-processing technique introduced turned out to be very useful, allowing the behavior of domain walls, which is often obscured by topological contrast, to be clearly observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.98447
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Computer simulation of damage processes during ion implantation (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 2733-2737 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new version for the marlowe code, which enables dynamic simulation of damage processes during ion implantation to be performed, has been developed. This simulation code is based on uses of the Ziegler–Biersack–Littmark potential [in Proceedings of the International Engineering Congress on Ion Sources and Ion-Assisted Technology, edited by T. Takagi (Ionic Co., Tokyo, 1983), p. 1861] for elastic scattering and Firsov's equation [O. B. Firsov, Sov. Phys. JETP 61, 1453 (1971)] for electron stopping. By introducing a damage function f(z)=l−exp[−ΔE(z)/Ecrit], where ΔE(z) is the deposition energy due to nuclear stopping per unit volume at depth z and Ecrit is the critical energy assessed from the experiment, the present code allows us to simulate how the crystalline structure at depth z transforms to the disordered structure, resulting in the marked change in the penetration of implanted ions as ion implantation proceeds. To examine the applicability of the present simulation code for practical ion implantation, we have performed dynamic simulations of the depth profile of implanted ions considering the changes in the crystalline structure due to disordering during ion implantations, and the results are compared with the experimental results of Mayer et al. [Can. J. Phys. 46, 664 (1968)]. The agreement between theoretical and experimental results has been found to be very good. A prediction on the dose dependence of lattice disorder for practical low-dose implantation in GaAs is also presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339400
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Dependence of coercivity on the anisotropy field in the Nd2Fe14B-type sintered magnets (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 3559-3561 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The temperature dependence of the coercivity (HcI)of Nd15(Fe1−xCox)77B8 and (Nd1−xDyx)15Fe77B8 sintered magnets and that of the saturation magnetization (Ms) and the anisotropy field (HA) of Nd2(Fe1−xCox)14B and (Nd1−xDyx)2Fe14B single crystals have been observed in the temperature range between 295 and 800 K. The dependence of the coercivity on the major magnetic properties of the matrix phase in the Nd-Fe-B based magnets are investigated using the μ0HA vs μ0HcI+Ms plot. It is demonstrated that this method of analysis is useful in studying the coercivity mechanism of the Nd-Fe-B based sintered magnets.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.338725
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  • 4
    Electronic Resource
    Electronic Resource
    Simple line-sampling apparatus for line frequency stroboscopic observation of periodic phenomena using scanning electron microscopy (1987)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 1811-1816 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Detailed operations of the apparatus for the stroboscopic observation of periodic phenomena at the region of line frequencies, such as the magnetic domain response, under the scanning electron microscopy are described in this paper. To achieve the stroboscopic observation at such low frequencies, a new line-sampling technique has been introduced instead of the conventional point-sampling method. In addition to the line-sampling stroboscopy, a multiframe operation is also introduced to display the stroboscopic images of different phase values simultaneously. These operations are simply realized by applying the raster separation and the blanking on the display monitor scope under the multiple line-sampling during the one-drive period. To demonstrate the ability of this simple apparatus, some results of the stroboscopic observation of magnetic domains in an Fe–Si sample under a 60-Hz drive field are also presented in this paper.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139662
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  • 5
    Electronic Resource
    Electronic Resource
    Evaluation of correction accuracy of several schemes for AES matrix effect correctionsPaper presented at ECASIA 89, Antibes, France, 23-27 October 1989. (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 15 (1990), S. 466-472 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A matrix effect correction is required to improve the accuracy of quantitative AES analysis. The correction includes terms involving the atomic density (n), electron back-scattering factor (R) and electron escape depth (L). Many schemes have been proposed by various people for corrections of the R and L terms. However, up to now, there have been no systematic investigations of the correction accuracy of the proposed schemes. We have evaluated the correction accuracy, based on measured intensity data for Au—Cu alloys of different compositions. Comparison was made between the observed intensity ratio K (=Iunk/Istd) and the calculated intensity, ratio K′ (= C(nunk/nstd)(Runk/Rstd)(Lunk/Lstd)), where C and I represent the concentration and intensity, respectively. The superscripts ‘unk’ and ‘std’ denote that the parameters are for unknown and standard specimens, here the pure elements. If the correction works well, the error Er (= K′ — K)/(K) will become smaller. Evaluations were carried out on three schemes for the R correction and on seven schemes for the L correction using the Au 239 eV, Au 2024 eV and Cu 920 eV transitions. The root mean square (RMS) of the calculated errors showed several per cent for the best case and 20-30% for the worst case. The RMS error varied a few per cent between schemes for the R correction but it varied ∼30% for the L correction.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740150805
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    The reliability of quantitative analysis with AES (1990)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 16 (1990), S. 140-143 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Japanese VAMAS-SCA working group is composed of 19 institutes. Three kind of Au—Cu alloys (Au 75 at.-%-Cu 25 at.-%, Au 50 at.-%-Cu 50 at.-%, Au 25 at.-%-Cu 75 at.-%) were prepared, and these specimens, pure Au and pure Cu were distributed to the members of the VAMAS-SCA working group. The surface concentrations of these alloys were calculated from the Auger peak amplitudes in two ways. One method used the published relative sensitivity factors, and the other used pure Au and Pure Cu as the standard materials. The mean values of the surface concentrations calculated with the published relative sensitivity factors were almost the same as those calculated with the standard materials. This means that the published relative sensitivity factors are reliable to some extent. The error of the surface concentration calculated with pure Au and pure Cu as the standard materials lay between about 3% and 10%, and that with the relative sensitivity factors lay between about 7% and 20%. The calculated surface concentrations of Au were larger than the bulk concentrations of Au when the matrix effect was neglected.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740160127
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    Paper (German National Licenses)
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