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  • 1985-1989  (3)
  • 1988  (3)
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  • 1985-1989  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 1048-1049 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The buildup of space charge following carrier injection under a prebreakdown field is often considered as a possible degradation process of a polymeric material. The energy released during trapping (phonons and photons) might be at the origin of bond breaking, even if the details of this process are not completely elucidated. Space-charge formation is of particular importance during ac stressing, since the nature of the trapped charge depends on stress polarity. We present in the following a very sensitive and new experimental setup that allows for the first time the analog, time-resolved measurement of trapped charge during ac polarization at high field in a dielectric material.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 336-343 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of gold-containing plasma-polymerized tetrafluoroethylene were prepared in an rf glow discharge. The films thus obtained showed a wide range of conductivities from insulating ( ρ〉1016 Ω cm) to metallic ( ρ∼3×10−6 Ω cm), depending on plasma conditions during synthesis. The synthesis of the polymer is described in detail since it presents several new aspects. The structure and composition of the films were investigated by x-ray photoelectron spectroscopy and transmission electron microscopy. Studies of current-voltage characteristics in the dielectric regime, i.e., below electrical percolation, show that the conduction is volume limited (Poole–Frenkel effect) in non-gold-containing films, and characterized by a bistable switching behavior for gold-rich films. Dielectric breakdown measurements were realized on self-healing metal-insulator-metal structures. The Weibull analysis of breakdown voltages and a statistical treatment of times to breakdown under constant stress give, respectively, the nominal breakdown field E0 and the specific breakdown field Ec. These two sets of data follow similar functional behavior as a function of metallic volume fraction in the films. Surprisingly, the breakdown-field values remain relativity high up to the percolation concentration.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Industrial & engineering chemistry research 27 (1988), S. 1282-1291 
    ISSN: 1520-5045
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
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