ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Various semi-empirical schemes for generating x-ray attenuation coefficients, μ/ρ, devised primarily for use in electron probe microanalysis, are considered for application in the PIXE analysis of thick specimens where the relevant x-ray energy region is 1-40 keV. Using selected high-accuracy experimental data, it is shown that current theoretical values of μ/ρ agree better with the data than do the various schemes. The errors transmitted into PIXE analysis by use of the theoretical values are estimated, and a new parameterization of these values suitable for microcomputer use is justified and tested.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300180511
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