ISSN:
1573-6784
Source:
Springer Online Journal Archives 1860-2000
Topics:
Process Engineering, Biotechnology, Nutrition Technology
Notes:
Summary X-Ray radiography was employed to monitor the diffusion of sucrose into plaster of Paris matrix containing 20% yeast cells. It was observed that the depth of penetration of tracer Pb detected by radiography matched with the substrate penetration detected by chemical test. However electron probe microanalysis (EPMA) did not yield any conclusive evidence regarding the movements of tracer Pb and substrate to the same extent.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00152757
Permalink