Electronic Resource
Springer
Fresenius' Zeitschrift für analytische Chemie
341 (1991), S. 308-313
ISSN:
1618-2650
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Summary The influence of different preparation conditions and substrate surface orientations on the superconducting properties of thin YBa2Cu3O7−x (YBCO) films on silicon was studied. Comparative electrical and surface spectroscopic measurements were performed. SAM and SIMS depth profile analysis show an enrichment of barium at the interface between the superconductor and silicon for samples with Tc〈76 K. Comparison with XPS data obtained for thin silicon films on YBCO indicates the formation of barium and yttrium silicates at the interface under these conditions.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00321569
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