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  • 1990-1994  (2)
  • 1991  (2)
  • 1
    Electronic Resource
    Electronic Resource
    Multiple inelastic scattering in high-energy electron diffraction and imaging (1991)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 47 (1991), S. 686-698 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A dynamical multiple elastic and inelastic electron scattering theory is proposed and is applied to the plural scattering cases of phonon, single-electron and valence (or plasmon) excitations. The incoherence of all the possible inelastic scattering processes of different energies and momenta is evaluated analytically before any numerical calculations. The effects of multiple scattering are equivalent partially to the broadening of the scattering function of a single inelastic process by those of others and partially to the re-scattering of the Kikuchi pattern produced in one inelastic process by others. The final diffraction pattern is a convoluted result of those Kikuchi patterns produced by different inelastic scattering processes. All these characteristics can be considered in just one single formula. The theory of multiple-phonon excitations in simulating high-angle annular-dark-field (ADF) scanning transmission electron-microscopy (STEM) images is proposed. It is shown that the single-phonon scattering model is a good approximation except at the points close to atomic nuclei if the electron probe is comparable in size to that of an atom. The higher-order phonon scattering may improve the resolution of the ADF STEM images of thin crystals.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767391005524
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Imaging friction tracks at diamond surfaces using reflection electron microscopy (1991)
    New York, NY : Wiley-Blackwell
    Journal of Electron Microscopy Technique 17 (1991), S. 231-240 
    Details
    ISSN: 0741-0581
    Keywords: Plastic deformation ; Adhesion friction ; Local contacting pressure ; Life and Medical Sciences ; Cell & Developmental Biology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Natural Sciences in General
    Notes: Reflection electron microscopy (REM) is applied to image the structure of polished natural diamond (001) surfaces (of 5 × 4 mm size) after friction experiments under a pressure below the critical value. Friction tracks marked by a diamond needle after a single pass movement under a pressure of 13 GPa can be seen in REM images and show non-uniform contrast. The surface shows relatively dark image contrast at the light contacted area, which is possibly due to the structural modification at the top atomic layer. The high local contacting pressure pushes part of the needle into the surface which causes fracture, resulting in the formation of grooves at the surface. It is possible to have plastic deformation in this process, but no evidence has been found for the presence of cracking. The observations support the adhesion frictional mechanism rather than the micro-cleavage model.
    Additional Material: 13 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/jemt.1060170210
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    Paper (German National Licenses)
    Fulltext
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