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  • 1990-1994  (3)
  • 1970-1974
  • 1992  (3)
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  • 1990-1994  (3)
  • 1970-1974
Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 2472-2477 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-fluence KrF-laser-irradiated silicon wafers exhibit a wealth of surface structures, which are different depending on the medium present above the surface during treatment with ultraviolet light. A special surface feature, appearing after treatment under water and in air, is analyzed with a Raman microprobe spectrometer. It is found to consist of leaflike formed silicon structures located above but still attached to the treated surface. During Raman scattering measurements the temperature of these morphological peculiarity rises considerably even at low cw probe laser powers because of geometrically limited thermal conductivity. It is shown that the temperatures, which were derived from the Stokes–to–anti-Stokes scattering intensity ratio are more reliable than those extracted from line shifts since the stress developing inside the Raman laser-heated leaflike microstructures is not known. A Raman microprobe scan of a damage spot, generated by UV treatment under water, reveals in the most cases an enhanced Raman intensity (factor of 10) in comparison with untreated areas. This enhancement is even larger at surface spots of smaller (≤1 μm) sizes and is attributed to the field enhancement of the incident and scattered radiation field caused by geometrical resonances.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 14 (1992), S. 1023-1032 
    ISSN: 0392-6737
    Keywords: Stimulated Raman scattering and spectra ; CARS ; Ultrafast optical techniques
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary Two techniques, using incoherent radiations of ns- or ps-pulse durations, respectively, used to obtain subps-time resolutions are described. Their advantages and limits are discussed. As a result both techniques should be used in addition to real fs-methods, because of their more simple arrangements and because of the possibility to determineT 2-times of vibrations even if more than one vibration is simultaneously excited.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Mathematische Annalen 294 (1992), S. 513-522 
    ISSN: 1432-1807
    Keywords: 22D10 ; 43A30
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Type of Medium: Electronic Resource
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