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The growth dynamics of thick sputtered copper coatings under the influence of surface diffusion: A quantitative atomic force microscopy study (1995)

Eisenmenger-Sittner, C. ; Bergauer, A. ; Bangert, H. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 78 (1995), S. 4899-4905

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ISSN: 1089-7550

Source: AIP Digital Archive

Topics: Physics

Notes: The evolution of surface features during the growth of a coating is of vital importance for the resulting overall film structure and morphology. In the low substrate temperature regime (T/TM〈0.3) the growth front of a single component material roughens due to fluctuations in the incoming particle beam (kinetic roughening) and relaxes via surface diffusion. The continuous deposition process thus leads to the evolution of surface features of large lateral extensions compared to the extension of the film-forming particles. A detailed experimental study of the surface evolution of sputtered copper coatings with thicknesses ranging from 300 to 105 A(ring) for a working gas pressure of 0.4 Pa is presented. The roughening as well as the relaxation of the film growth front is studied by means of atomic force microscopy (AFM). The increasing lateral extension of the surface features during growth (coarsening) can well be described by a deterministic continuum model of surface diffusion. The model is capable of predicting the evolution of the surface profile's Fourier transform for increasing deposition times (i.e., increasing film thickness). A retransformation from k space to real space allows for a direct comparison of surface profiles obtained from AFM scans with those resulting from the continuum model and gives good qualitative agreement of the profile shapes. © 1995 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.359778

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Befunde in der Panoramaschichtaufnahme bei funktionsgestörten kieferorthopädischen Patienten (1995)

Bauer, W. ; Augthun, M. ; Wehrbein, H. ; [et al.]

Springer

Journal of orofacial orthopedics 56 (1995), S. 318-326

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ISSN: 1615-6714

Source: Springer Online Journal Archives 1860-2000

Topics: Medicine

Description / Table of Contents: Summary In our study of 107 patients, for whom data derived from clinical functional analysis, axiography and, in part, magnet resonance imaging, were present, we were abte to show that in routine orthodontic diagnosis the use of panotamie X-ray in the normal course of a general examination of the mandibular joint can also provide important indications of the presence of cranio-mandibular disorders. The panoramic X-ray revealed that in patients withAngle class II and front deep and open bite there were significantly more changes in the form of the condyles. A definite morphologie finding of a retracted fovea pterygoidea was found frequently in patients with anterior disk replacement with or withour reduction. Lastly, the panoramic X-ray showed that a change in form of the condyles, with in some cases a serlous arthrosis, occurs significantly most frequent in patients with anterior displacement without reduction.

Notes: Zusammenfassung In unserer Studie konnte anhand von 107 Patienten, bei denen klinisch/axiographische und zum Teil magnetresonanztomographsche Funktionsbefunde vorlagen, gezeigt werden, daß die Panoramaschichtaufnahme innerhalb der kieferorthopädischen Routmediagnostik im Sinne einer orientierenden Übersichr der Kiefergelenke wichtige Hinweise auf das Vorliegen von Funktionsstörungen geben kann. Patienten mit dentaler Klasse-II-Bißlage und den Frontzahnanomalien Tiefbiß und offener Biß wiesen in der Panoramaschichtaufnahme signifikant häufiger Formveränderungen, der Kondylen auf. Der spezifische morphologische Kiefergelenkbefund einer Einziehung der Fovea pterygoidea trat vermehrt in Fällen mit anteriorer Diskusverlagerung mit oder ohne Reposition auf Formveranderte Kiefergelenkköpte mit teilweise gravierenden Kiefergelenkarthrosen waren signifikant am häuflgsten bei Patienten mit anteriorer Diskusverlagerung ohne Reposifion aufzufinden.