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  • 1995-1999  (2)
  • 1998  (1)
  • 1996  (1)
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  • 1995-1999  (2)
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  • 1998  (1)
  • 1996  (1)
  • 1995  (3)
  • 1
    Electronic Resource
    Electronic Resource
    Pulsed CO2 laser ablation of graphite and polymers (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 2286-2290 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spectroscopic analysis of the emission plumes of graphite, polyimide, polyethylene terepthalate, and polymethylmethacrylate that have been ablated by using a pulsed CO2 laser operating at 10.6 μm shows the presence of CN and C2, species not previously reported for CO2 laser ablation. The gross dynamics of the luminous plume, which was studied by using a streak camera, compares favorably with predictions from the snowplow model, which also accurately forecasts the time history of the plume expansion for a wide range of background gas pressures and laser fluences. Framing shadowgraphy reveals the onset of laser-supported detonation waves at approximately 50 mbar Ar, thus somewhat limiting the validity of this model. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366970
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    The role of ambient gas scattering effect and lead oxide formation in pulsed laser deposition of lead–zirconate–titanate thin films (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 2030-2032 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The angular distribution of lead in films deposited by pulsed laser irradiation of lead–zirconate–titanate and lead targets are studied as a function of ambient gas (argon or oxygen), gas pressure, and substrate temperature. When the substrate is kept in vacuum and at room temperature, a dip in the lead content attributable to the intrinsic resputtering of lead is observed at the position of the target surface normal. In the presence of an ambient gas, the dip disappears and the lead content increases at all angles. These results are attributed to a reduction of resputtering arising from scattering of the ablated species by ambient gas molecules. Under ambient oxygen and at high substrate temperature, the retention of lead content in the deposited films is largely due to the formation of lead oxide. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.116869
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
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