ISSN:
0142-2421
Keywords:
scanning force microscopy
;
polymers
;
polyamide
;
tensile tester
;
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The structure and the mechanical properties of polyamide (PA) films were studied with scanning force microscopy (SFM). The spherulitic structure of the films was resolved and the amorphous and crystalline regions could be identified without heavy metal staining or evaporation. The identification was achieved with different contrast mechanisms in SFM, such as the force modulation technique and phase imaging.The mechanical properties of the PA films were investigated with a tensile tester. The films were drawn in a uniaxial direction. The deformation of the spherulite structures could be imaged byin situ SFM. A schematic model for the interpretation of the observed structures is presented.© 1997 John Wiley & Sons, Ltd.
Additional Material:
8 Ill.
Type of Medium:
Electronic Resource
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