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  • 1995-1999  (2)
  • 1997  (2)
  • Multichip Module test and diagnosis  (1)
  • Numerical Methods and Modeling  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 10 (1997), S. 127-136 
    ISSN: 1573-0727
    Keywords: Multichip Module test and diagnosis ; system diagnosis ; built-in self-test ; signature analysis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract A system diagnosis technique for multichip module (MCM) ispresented. The proposed technique uses built-in probes for monitoringinternal responses and, with a signature analysis scheme based onerror correcting codes, identifies the probes where erroneous test responses have been detected. Conceptsfrom system diagnosis is used in conjunction withsignature analysis in developing the proposed MCM diagnosistechnique, where the resulting patterns of the faulty probes are usedin the identification of the faulty submodules (dies). The proposedtechnique offers a diagnostic capability in system functional test.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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  • 2
    Electronic Resource
    Electronic Resource
    Chichester : Wiley-Blackwell
    Communications in Numerical Methods in Engineering 13 (1997), S. 495-510 
    ISSN: 1069-8299
    Keywords: classical deformation ; shear deformation ; axisymmetric circular plates ; unified finite elements ; Engineering ; Numerical Methods and Modeling
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mathematics , Technology
    Notes: In this paper a unified finite element model that contains the Euler-Bernoulli, Timoshenko and simplified Reddy third-order beam theories as special cases is presented. The element has only four degrees of freedom, namely deflection and rotation at each of its two nodes. Depending on the choice of the element type, the general stiffness matrix can be specialized to any of the three theories by merely assigning proper values to parameters introduced in the development. The element does not experience shear locking, and gives exact generalized nodal displacements for Euler-Bernoulli and Timoshenko beam theories when the beam is homogeneous and has constant geometric properties. While the Timoshenko beam theory requires a shear correction factor, the third-order beam theory does not require specification of a shear correction factor. An extension of the work to axisymmetric bending of circular plates is also presented. A stiffness matrix based on the exact analytical form of the solution of the first-order theory of circular plates is derived. © 1997 John Wiley & Sons, Ltd.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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