Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • 1995-1999  (2)
  • 1998  (2)
Source
Material
Years
  • 1995-1999  (2)
Year
Keywords
  • 1
    Electronic Resource
    Electronic Resource
    Formation of mesostructures at the surface of ferritic steel and a nickel monocrystal under increasing load – an in situ AFM experiment (1998)
    Springer
    Applied physics 66 (1998), S. 1113-1116 
    Details
    ISSN: 1432-0630
    Keywords: PACS: 81.30; 61.55.F
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: 2 was examined by AFM in contact mode. On loading the polycrystalline sample the surface roughness increases and visible mesoscopic structures of about 25 μm in diameter appear. The fractal dimension df of the surface topography was analyzed and it was found that df starts to increase at the yield strength and finally ends in a plateau. Investigation of the nickel monocrystal showed the formation of well-characterized slip bands and non-regular substructures beyond a short elastic region. The development of the fractal dimension is similar to that of the polycrystalline steel sample. The results obtained are discussed in the framework of mesomechanics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Lock-in-phase analysis of n-GaAs photoreflectance spectra (1998)
    Springer
    Semiconductors 32 (1998), S. 245-249 
    Details
    ISSN: 1063-7826
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract The phase dependence of the photoreflectance signal in the region of the E 0 transitions in GaAs samples has been investigated using the two-channel lock-in technique. The spectral components and their synchronous phases have been established as the result of a detailed analysis of the photoreflectance spectra. The time constants of the photoreflectance signal have been calculated for the observed single-component and multicomponent photoreflectance spectra. The time dependence ΔR/R j∼±exp(−t/τ j) of the photoreflectance signal is due to the delayed reaction to the photomodulation of the electric field in the region of the semiconductor surface or interface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1134/1.1187549
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...