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  • 2000-2004  (1)
  • 2000  (1)
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  • 2000-2004  (1)
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    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 1110-1112 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Cleaved MgO(100) single crystals were implanted with 30 keV 3He ions with doses varying from 1×1019 to 1×1020 m−2 and subsequently thermally annealed from 100 to 1100 °C. Transmission electron microscopy observations revealed the existence of sharply rectangular nanosize voids at a depth slightly shallower than the helium-implantation range. Monitoring of the defect depth profile and the retained amount of helium was performed by positron-beam analysis and neutron depth profiling, respectively. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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