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  • 2005-2009  (1)
  • 2000-2004  (4)
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  • 1
    Electronic Resource
    Electronic Resource
    Microwave near-field imaging of conducting objects of a simple geometric shape (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3927-3932 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We study imaging properties of a 90 GHz microwave scanning probe consisting of a thin slit aperture (width of 10–100 μm) in the waveguide endwall. We perform vector measurements of the near-field reflectivity of test samples (conducting dot, strip, half plane, plane) at various probe–sample separations and orientations. Experimental results for small objects agree fairly well with analytical calculations and computer simulations and can be described by a quasistatic model. Experimental results for extended conducting objects show pronounced deviations from the quasistatic model due to excitation of the surface waves. Our experimental results demonstrate several peculiar features which have not been properly addressed in the context of near-field imaging, namely: (i) strong collimation of the fields away from the probe up to a distance equal to the probe width, (ii) very weak phase dependence on distance in the extreme near field, and (iii) excitation of surface waves above conducting surfaces. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1289680
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    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    High-frequency eddy-current technique for thickness measurement of micron-thick conducting layers (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1634-1636 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We demonstrate a reflection-mode eddy-current technique operating in the 100 MHz to 5 GHz range. It allows contactless measurement of the thickness of conducting layers (Ag, Al, Cu, W, etc.) 0.1–1 μm thick with the spatial resolution of 1–2 mm. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1355298
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Local contactless measurement of the ordinary and extraordinary Hall effect using near-field microwave microscopy (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 1776-1778 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a polarization-sensitive scanning microwave microscope based on a bimodal dielectric resonator with a cross-slit aperture. The microscope operates at ∼26 GHz in the reflection mode and has a subwavelength spatial resolution. It allows contactless mapping of the conductivity tensor, including magnetic-field-induced terms such as the Hall effect. We demonstrate local contactless measurement of the ordinary Hall effect in semiconducting wafers and of the extraordinary Hall effect in thin ferromagnetic Ni films. The latter yields out-of-plane magnetization. The microwave measurements are in good agreement with the dc Hall-effect measurements. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1456541
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Near-field scanning microwave probe based on a dielectric resonator (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 2073-2079 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report a near-field microwave microscopy based on a novel scanning probe—a long and narrow slot microfabricated on the convex surface of the dielectric resonator. The probe is mounted in the cylindrical waveguide. Tunable coupling to the probe is effectuated through the variable air gap. The whole probe is very compact, has a coaxial input, operates at 25–30 GHz, has a spatial resolution of 1–10 μm and, most important, has a low impedance of ∼20 Ω. This allows us to use it for characterization of metallic layers with high conductivity, in particular, thickness mapping. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1351837
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    Paper (German National Licenses)
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  • 5
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    Fast Light and Focusing in 2D Photonic Quasicrystals (2009)
    Details
    Publication Date: 2020-03-09
    Language: English
    Type: article , doc-type:article
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