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  • 2005-2009
  • 1995-1999  (3)
  • assertion test generation  (2)
  • Al−Li alloy  (1)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Advanced performance materials 2 (1995), S. 203-216 
    ISSN: 1572-8765
    Keywords: superplasticity ; P/M superalloy ; Al−Li alloy ; metal matrix composites ; intermetallic compound ; ceramics
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract In this paper, some of the recent research progress on advanced materials supported by National Advanced Materials Committee of China are reviewed. The basic characteristics of plasticity and superplasticity, such as stress-strain curves, strain rate,m-value etc. are discussed. The P/M superalloy, ceramics, aluminumlithium alloys, metal matrix composites, intermetallic compounds, magnetic alloys and high transition temperature superconductive materials have been selected as advanced materials for plasticity and superplasticity study.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 15 (1999), S. 191-205 
    ISSN: 1573-0727
    Keywords: array ; logic verification ; design error ; symbolic trajectory evaluation ; assertion ; assertion test generation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Design validation for embedded arrays remains as a challenging problem in today's microprocessor design environment. Although several methods for validating embedded arrays have been proposed, not much has been done to characterize the strengths and weaknesses of these methods. This paper provides a comprehensive study of various design validation approaches adopted at the Somerset PowerPC Design Center in the past, including methods from both formal verification and test generation. Effectiveness of these approaches will be measured based on automatic design error injection and simulation at both gate and transistor levels. Experience of using different validation approaches on recent PowerPC microprocessor arrays will be analyzed and discussed.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Journal of electronic testing 13 (1998), S. 121-135 
    ISSN: 1573-0727
    Keywords: high-level test generation ; assertion test generation ; design validation ; logic verification ; symbolic trajectory evaluation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Test and validation of embedded array blocks remains a major challenge in today's microprocessor design environment. The difficulty comes from twofold, the sizes of the arrays and the complexity of their timing and control. This paper describes a novel test generation methodology for test and validation of microprocessor embedded arrays. Unlike traditional ATPG methods, our test generation method is based upon the high-level assertion specification which is originally used for the purpose of formal verification. The superiority of these assertion tests over the traditional ATPG tests will be discussed and shown through various experiments on recent PowerPC microprocessor designs.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
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