ISSN:
1662-8985
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
The Zn-Se bilayer structure prepared using thermal evaporation method at pressure10-5 Torr. These films annealed in the vacuum for two hours on different constant temperatures. Theoptical band gap was found to be varying with annealing temperature due to removal of defects andincrease in grain size. It was also observed by the X-ray diffraction pattern the grain size of the filmincrease with annealing temperature. The lattice constant of hexagonal structure of these films isfound to be a =b=4.42Å and c=5.68Å. The dominant peaks to be at 23.2°,28° and 43.9° havingvalues (100), (002) and (111) respectively. The Rutherford back scattering data of these filmsconfirmed the mixing of elements with time
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/40/transtech_doi~10.4028%252Fwww.scientific.net%252FAMR.31.153.pdf
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