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  • 2005-2009  (4)
  • 1
    Electronic Resource
    Electronic Resource
    A New Ellipse Recognition Algorithm for CCD Camera (2005)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 295-296 (Oct. 2005), p. 729-734 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: A novel 2D pattern used in camera calibration is presented. An array of circles with one feature circle located at the center is photo echoed on the pattern. According to the category of the pattern, an ellipse recognition algorithm is proposed. It facilitates acquisition of the distinguished points without human operation. The 3D space coordinate system of these points can be established automatically and accurately. A series of experiments show that the algorithm is robust and reliable. The calibration error is less than 0.4 pixels. The new ellipse recognition algorithm can be widely used for computer vision applications
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/50/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.295-296.729.pdf
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Nanocrystalline Formation during Mechanical Attrition of Cobalt (2006)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 503-504 (Jan. 2006), p. 751-756 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: The nanocrystalline (nc) formation was studied in cobalt (a mixture of ε (hexagonal close packed) and γ (face-centered cubic) phases) subjected to surface mechanical attrition treatment. Electron microscopy revealed the operation of{ 10 10 }〈 1120 〉 prismatic and {0001}〈 1120 〉 basal slip in the ε phase, leading to the successive subdivision of grains to nanoscale. In particular, the dislocation splitting into the stacking faults was observed to occur in ultrafine and nc grains. By contrast, the planar dislocation arrays, twins and martensites were evidenced in the γ phase. The strain-induced γ→ε martensitic transformation was found to progress continuously in ultrafine and nc grains as the strain increased. The nc formation in the γ phase was interpreted in terms of the martensitic transformation and twinning
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/11/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.503-504.751.pdf
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    A Rapid Calibration Method for the Laser Scanning 3D Measurement System (2005)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 295-296 (Oct. 2005), p. 735-740 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: A rapid calibration method for the parameters of a laser light plane scanning 3D measurement system is proposed. The mathematic model and the calibrated parameters of the measurement system are presented. A novel orthogonal calibration jig composed of two orthogonal planes is designed. The CCD camera parameters and the light plane parameters of the measurement system can be rapidly calibrated with the orthogonal calibration jig. The laser scanning 3D measurement system is calibrated with the calibration jig. A standard plane is measured at different positions. The accuracy is better than 0.1mm
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/50/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.295-296.735.pdf
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Dynamic Torsional Buckling of an Embedded Double-Walled Carbon Nanotube (2007)
    s.l. ; Stafa-Zurich, Switzerland
    Key engineering materials Vol. 334-335 (Mar. 2007), p. 745-748 
    Details
    ISSN: 1013-9826
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: An elastic double-shell model based on continuum mechanics is presented to study thedynamic torsional buckling of an embedded double-walled carbon nanotube (EDWCNT). Based onthe model, a condition is derived to predict the buckling load of the EDWCNT. It is shown that thebuckling load of the EDWCNT for dynamic torsional buckling is no less than that for the statictorsional buckling. Further, the effect of the van der Waals forces is discussed when an innernanotube is inserted into an embedded outer one. In particular, the paper shows that, in the absenceof the initial van der Waals forces, the buckling load of an EDWCNT is always in-between that ofan isolated inner tube and of an embedded outer nanotube, which is different from the resultobtained by neglecting the difference of radii. This indicates that disregarding the difference of theradii of the double-walled nanotubes can not properly describe the effect of the van der Waalsforces between interlayer spacing
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/01/53/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.334-335.745.pdf
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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