ISSN:
1089-7690
Source:
AIP Digital Archive
Topics:
Physics
,
Chemistry and Pharmacology
Notes:
Recent developments in the use of near-field scanning optical microscopy-based techniques to monitor and image physical processes related to device function in thin film organic materials are surveyed. By combining subwavelength optical probes with electro-optical spectroscopic techniques, methods have been developed for measuring the dynamics, spatial variation, and diffusion of energy and charge carriers in organic electro-optical devices. Materials investigated include polymer thin films, polycrystalline and amorphous (glassy) organic films, liquid crystalline materials, and molecular semiconductor heterostructures. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.481386
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