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  • 1
    Electronic Resource
    Electronic Resource
    Jansen type of spondylometaphyseal dysplasia (2000)
    Springer
    Skeletal radiology 29 (2000), S. 239-242 
    Details
    ISSN: 1432-2161
    Keywords: Key words Osteochondrodysplasia ; Metaphyseal dysplasia ; Metaphysis ; Spine ; Short stature
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract  Metaphyseal dysplasia, type Jansen (JMD), is a rare skeletal dysplasia with characteristic radiographic abnormalities. Of the various types of metaphyseal dysplasia, JMD shows the most severe alteration in metaphyseal architecture. All of the long tubular bones, including those of the hands and feet, show metaphyseal irregularity with a fragmented appearance and slight widening. The adjacent physes are abnormally widened, while the epiphyses tend to be slightly enlarged, rounded but otherwise normal. The spine in infancy and childhood usually appears normal. This report describes a young girl with metaphyseal changes typical of JMD except for the hands and feet, which appeared normal. She also showed very unusual abnormalities of the spine. This appears, therefore, to represent a unique osteochondrodysplasia for which we propose the term spondylometaphyseal dysplasia, type Jansen.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s002560050601
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Atomic force microscopy using plastic replicas (2000)
    Springer
    Journal of materials science 35 (2000), S. 757-765 
    Details
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract Scanning probe microscopy is now an accepted tool in both industrial and research efforts. Its development parallels the advances in technology and imaging applications found in the history of progress of both transmission electron microscopy and scanning electron microscopy. All three forms of microscopy ultimately suffer a fundamental application problem—situations arise where it is either unreasonable or impossible to observe a particular sample within the sample stage of the microscope. For the transmission and electron and scanning electron microscopies, this problem has been resolved by resorting to making a replica of the area of interest on the actual sample and preparing the replica so that it may be imaged directly by the desired microscopy technique. This work attempts to ascertain the suitability of observing replicas using a scanned probe microscope; specifically, employing the techniques of atomic force microscopy to image plastic surface replicas.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1004769620450
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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