ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Cold-drawn Electrolytic Tough Pitch copper wires have been investigated withNeutron Diffraction and Electron Back Scattered Diffraction. The drawn copper wires (38% reduction in area) develop major 〈111〉 and minor 〈001〉 fiber textures. It appears that the texture intensity of the reinforcements within the 〈111〉 and 〈001〉 fibers is more pronounced in the center and intermediate part of the wires. During the first annealing time, it is found that the recrystallization kinetics is enhanced when oxygen content is increased. The recrystallized fraction within the intermediate zone of the wire is two times larger in the cathode with higher oxygen content. The mechanisms at the origin of this acceleration of recrystallization kineticswill be discussed taking into account the presence of Cu2O type oxides
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/09/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.467-470.471.pdf
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