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  • 1995-1999  (2)
  • 1990-1994  (3)
  • 1985-1989  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    X-ray reflectivity of ultrathin twist-bonded silicon wafers (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 3509-3511 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ultrathin Si (001) layers (〈15 nm) are hydrophobic bonded to a full 4 in. Si (001) wafer. The interface quality and surface roughness, checked by specular x-ray reflectivity, are very good. This technique, well suited to measure the homogeneity thickness, shows that the samples have very small thickness fluctuations, and no extended defects. Quantitative analysis proves that the interfacial layer resulting from the bonding is very thin (about 8 Å). Its atomic density is significantly different from bulk Si only for large bonding twist angles (〉5°). © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.125371
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Anomalous small-angle X-ray diffraction of an Nd-Fe multilayer (1991)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 24 (1991), S. 156-163 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The Bragg peak intensities, related to the electronic concentration profile, depend both on atomic concentrations and on specific volumes. Anomalous dispersion, using synchrotron radiation, produces a variation of the scattered intensity, which in principle allows a separation of the two contributions. The kinematic approximation for diffraction of thick multilayers allows an easy evaluation of the ratio of specific volumes, but the entire reflectivity curves and their deformations with photon wavelength can be explained by the interferences between the Kiessig fringes and diffraction maxima in a kinematic approximation. A full optical treatment confirms the previous analysis. Finally, the relaxations occurring during Nd–Fe interdiffusion are too small to be measured in our experimental conditions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889890011633
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    X-ray transmissivity measurements using dynamical diffraction under grazing-incidence conditions (1990)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 46 (1990), S. 526-534 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The dependence of the X-ray transmission coefficient of a thin-film coating as a function of incidence has been measured in the grazing-angle range. The method is based on the use of a substrate Bragg reflection to redirect the incident or transmitted beams. It allows grazing incidence from both outside and inside the substrate to be performed. The geometry of the experiment is described. The results are interpreted by means of dynamical theory combined with an optical formalism for stratified systems. Experimental results and applications are compared with reflectivity data.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767390002094
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    X-ray phase determination in multilayers (1989)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 45 (1989), S. 445-453 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A procedure is described for the determination of the phases of waves scattered by a multilayer structure using interference between surface reflections and structure diffraction. The applicability of the method to Langmuir-Blodgett and metallic sputtered multilayers is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767389001327
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  • 5
    Electronic Resource
    Electronic Resource
    Characterization of a chromia–alumina catalyst using small-angle neutron scattering (1990)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 23 (1990), S. 424-429 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Neutron scattering has been employed to study the pore structure of a chromia–alumina catalyst. The results indicated the existence of three distinct scattering regimes with distinct slopes corresponding to the values of the wavevector, Q. The analysis of the scattering in these regions suggested that the large-Q region corresponds to Porod's law scattering and provides information on the specific surface area. The intermediate Q region arises from scattering from hollow capillaries and provides information on the dimension of the capillaries. The small-Q behaviour arises from the relative spatial arrangement of capillaries, which appear to form a `fractal' network.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889890006483
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  • 6
    Electronic Resource
    Electronic Resource
    Study of the polymer-surfactant interaction in black films and monolayers (1997)
    Springer
    Colloid & polymer science 105 (1997), S. 113-117 
    Details
    ISSN: 1435-1536
    Keywords: Black films ; monolayers ; polymer-surfactant interaction ; X-ray reflectivity ; surface diffraction
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract We present a study of the structure of mixed layers formed after deposition of one and two polymer monolayers on a surfactant sublayer. Two complementary systems are investigated: polymer-surfactant layers made at the surface of surfactant solutions and black films drawn from the same solutions. We mainly use the X-ray reflectivity; our experimental results are compared with those obtained by other techniques. In addition some preliminary surface diffraction experiments are reported here; they show that there is a long range in-plane order in a Newton black film.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01188936
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    Paper (German National Licenses)
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