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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 153-153 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 10 (1981), S. 138-146 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: It is shown that the depth distribution of X-ray production in the electron microprobe can be accurately described by a Gaussian modified at the sample surface by a transient. Assuming that the Gaussian is a consequence of the electrons undergoing a random walk in the sample and that the transient corresponds with the change from collimated to random electron trajectories enables theoretical values for the amplitudes and coefficients of the two functions to be predicted. There is excellent agreement between the predicted and the observed values. The Lenard coefficient and the electron range can both be estimated from the coefficient in the Gaussian. It is suggested that for microprobe work, Lenard's law for electron absorption be replaced by this revised law. Both the absorption and atomic number corrections of the traditional ZAF approach are replaced by the new function.
    Additional Material: 14 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    Fire and Materials 19 (1995), S. 109-118 
    ISSN: 0308-0501
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Architecture, Civil Engineering, Surveying , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: The fire-retardant performances of various surface coatings for naval ship interior applications have been evaluated by a number of small-scale fire test methods. The coatings were eveluated as topcoats by cone calorimetry and limiting oxygen index methods and as primer/topcoat systems by radiat heating, direct flame impingement and reverse panel heating procedures. The coatings investigated were (1) a solvent-based epoxy polyester, (2) a solvent-based fireretardant alkyd,(3) a solvent-based chlorimated alkyd and (4) a water-based acrylic. In terms of the measured parameters, the chlorinated alkyd has superior fire properties while the epoxy polyserter, the fire-retardant alkyd and parameters, the chlorinated alkyd has superior fire properties while the epoxy polyester, the fire-retardant alkyd and the acrylic have significat disadvantages in relation to fire propagation. The relatively low amount of hydrogen chloride (∼ 0.3% - mass per initial mass) evolved by the chlorinated alkyd during cone calorimetric combustion and its outstanding fire-retardant properties have resulted in it being considered acceptable for naval ship interior applications.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 11 (1982), S. 187-193 
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Gaussian expression for φ(ρz) has been used as the basis of a computer program for quantitative electron probe microanalysis. Corrections for absorption and atomic number are combined within the expression for φ(ρz) whereas the fluorescence correction is based on numerical integration over the primary and secondary intensities. Error histograms based on about 500 published analyses of standard specimens have been used to adjust the parameters in the Gaussian expression for optimum accuracy. The resultant error histograms are as narrow as those obtained for the most accurate of the current ZAF correction procedures. Extension of the method to non-normal electron incidence is relatively straightforward.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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