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  • 1995-1999
  • 1975-1979  (2)
  • 1905-1909
  • Analytical Chemistry and Spectroscopy  (2)
  • 1
    Electronic Resource
    Electronic Resource
    Measurement of oxygen K absorption spectra using an electron microprobe (1975)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 4 (1975), S. 65-70 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A technique is outlined which use the electron microprobe to obtain X-ray absorption spectra, by photon absorption, in the long wavelength region. Spectra are presented for SiO, SiO2, rectorite, talc, vermiculite, V2O5, Cr2O3, Fe2O3, maghemite, Mylar and collodion. For all compounds the main absorption edge is near to 536 eV, which is significantly higher than core binding measured in ESCA studies. The transition metal oxides and organic films show a sharp absorption line near 531 eV in addition to the above edge. This absorption line is very close in energy to the anomalous peak observed in the oxygen K emission spectra when using KAP or other acid phthalate crystals and it seems likely that the two phenomena are associated.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300040206
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    The atomic number dependence of the X-ray continuum intensity and the practical calculation of background in energy dispersive electron microprobe analysis (1975)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 4 (1975), S. 149-156 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Computer fitting techniques have been used to derive a new expression for the relationship between X-ray continuum intensity and atomic number for a range of electron acelerating potentials up to 25 kV, continuum energies up to 10 keV and average atomic numbers up to thirty. A practical approach to background corrections in energy dispersive electron microprobe analysis, which utilizes this expression, is outlined. The procedure should lead to significant improvements in both accuracy and detection limits in this method of X-ray analysis.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300040311
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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